We have EG6000 probers ready for immediate delivery! Please CONTACT US regarding this, if interested!
The EG6000 300mm wafer prober is a highly accurate system that keeps longevity, reliability, wafer throughput, and most importantly test repeatability in mind.
Active vibration cancellation allows for consistent contact resistance, reducing yield loss from vibration.
50 nanometer Z accuracy with grid-based surface mapping, closed-loop chuck positioning, and advances probe-to-pad alignment algorithms.
Quickly test between temperatures of -40°C and 120°C without having to remove the lot.
